Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...

The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...

WEST LAFAYETTE, Ind. – Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use ...

WEST LAFAYETTE, Ind. - Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors - a potential tool that industry could use ...