Read more Test Ideas and Design Ideas here. As ICs increase in complexity and decrease in size, their pin counts drop or, at best, remain constant. The result: a need for pin-saving measures like ...

This application note describes methods for testing components using an oscilloscope and waveform generator. We will show you how to test capacitors, inductors, diodes, bi-polar transistors, output ...

Microsoft is now testing its own in-house AI image generation model. You can test the new model at the LMArena leaderboard site. The new model will soon be available in Copilot and Bing Image Creator.